Finite element analysis of charge injection and transport in a dielectric liquid

被引：4

作者：

Lee, Se-Hee ^{[1
,2
]}

O'Sullivan, Francis ^{[2
]}

Park, Il-Han ^{[2
,3
]}

Zahn, Markus ^{[2
]}

Pettersson, Leif ^{[4
]}

Liu, Rongsheng ^{[4
]}

Hjortstam, Olof ^{[4
]}

Jaksts, Albert ^{[4
]}

Auletta, Tommaso ^{[4
]}

Gafvert, Uno ^{[4
]}

机构：

[1] Korea Electrotechnol Res Inst, Adv Power Apparatus Grp, Chang Won 641120, South Korea

[2] MIT, Electromagnet & Elect Syst Lab, Dept Comp Sci & Elect Engn, Cambridge, MA 02139 USA

[3] Sungkyunkwan Univ, Sch Informat & Commun Engn, Suwon 440746, South Korea

[4] ABB Corporate Res, Baden, Switzerland

来源：

2006 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA | 2006年

关键词：

D O I：

10.1109/CEIDP.2006.312078

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Unipolar and bipolar space charge injection and propagation is analyzed under simplified linear and Fowler-Nordheim charge injection conditions for parallel plane or needle-sphere electrodes stressed by a step voltage. To verify our finite element numerical method, we first tested parallel plane electrodes with a simplified linear charge injection law for unipolar space charge propagation that showed good agreement with older closed form theoretical analysis. Finally, we analyzed tip-sphere electrodes for bipolar space charge propagation including Langevin recombination using finite element analysis.

引用

页码：129 / 132

页数：4

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