Spectral Interrogation of ZnO Thin Film for Lossy Mode Resonance Sensors

被引:1
|
作者
Kumar, Anil [1 ]
Rakesh [1 ]
Kumar, Manoj [1 ]
Bhatt, Geeta [1 ]
Khanna, M. K. [1 ]
Kapoor, Avinashi [2 ]
机构
[1] Bhaskaracharya Coll Appl Sci, Sec 2,Phase 1, New Delhi 110075, India
[2] Univ Delhi, Dept Elect Sci, South Campus, New Delhi 110021, India
关键词
Lossy Mode Resonance; Spectral Sensitivity; Refractive Index Sensor; ZnO Thin Film; SURFACE-PLASMON RESONANCE; THICKNESS;
D O I
10.1166/asl.2018.10846
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
ZnO thin film is theoretically investigated to explore its sensing characteristics using Fresnel reflection coefficients. Although SPR (Surface plasmon resonance) spectrum of the ZnO film has been investigated by the scientific community at a large scale but its LMR (Lossy Mode Resonance) spectrum is yet to be investigated in depth. Spectral interrogations of ZnO thin film placed on the glass prism are carried out for the generation of LMRs. The results are presented for TE as well as TM polarizations. The effect of a matching layer, inserted between substrate (prism) and ZnO thin film is also discussed in detail. A substantial improvement in the sensitivity is observed after introducing the optimized matching layer. FWHM (Full width at half maximum) of the various sensor configurations is calculated and it is inferred that a high index matching layer gives higher sensitivity. On the other hand, a low index matching layer results in higher resolution. It is shown that a high sensitivity value of 5220 nm/RIU can be achieved for TM polarization. The proposed sensor configurations with clad index range (1.44-1.48) may find applications to sense various petroleum products.
引用
收藏
页码:796 / 801
页数:6
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