Micromanipulation system using scanning electron microscope

被引:3
|
作者
Nakazato, Y. [1 ]
Yuasa, T. [1 ]
Sekine, G. [1 ]
Miyazawa, H. [1 ]
Jin, M. [1 ]
Takeuchi, S. [1 ]
Ariga, Y. [1 ]
Murakawa, M. [1 ]
机构
[1] Nippon Inst Technol, Miyashiro, Saitama, Japan
关键词
DIAMOND;
D O I
10.1007/s00542-009-0815-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study, we aimed to develop a micromechanism in which constituent parts of mu m order are used and to establish the handling technology required to achieve this. On the basis of the results of previous studies, we fabricated end effectors driven by a small piece of shape memory alloy (SMA) and succeeded in grasping microobjects on the order of 10-40 mu m. However, when the size of an object is 10 mu m or smaller, because this size is equivalent to the resolution of optical microscopes, it is necessary to improve and change the design of observation technology to manipulate much smaller objects. In this study, an SEM was used as the observation system and the manipulation system was modified to be compatible with this observation system. A manipulation system for grasping much smaller objects was designed and developed.
引用
收藏
页码:859 / 864
页数:6
相关论文
共 50 条
  • [1] Micromanipulation system using scanning electron microscope
    Y. Nakazato
    T. Yuasa
    G. Sekine
    H. Miyazawa
    M. Jin
    S. Takeuchi
    Y. Ariga
    M. Murakawa
    Microsystem Technologies, 2009, 15 : 859 - 864
  • [2] Design of a micromanipulation system for high temperature operation in an environmental scanning electron microscope (ESEM)
    Samara-Ratna, P.
    Atkinson, H. V.
    Stevenson, T.
    Hainsworth, S. V.
    Sykes, J.
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2007, 17 (01) : 104 - 114
  • [3] Image-based autonomous micromanipulation system for arrangement of spheres in a scanning electron microscope
    Kasaya, T
    Miyazaki, HT
    Saito, S
    Koyano, K
    Yamaura, T
    Sato, T
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (06): : 2033 - 2042
  • [4] Kinematics of mechanical and adhesional micromanipulation under a scanning electron microscope
    Saito, S
    Miyazaki, HT
    Sato, T
    Takahashi, K
    JOURNAL OF APPLIED PHYSICS, 2002, 92 (09) : 5140 - 5149
  • [5] Graphical template software for accurate micromanipulation in a scanning electron microscope
    Kasaya, Takeshi
    Miyazaki, Hideki T.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2009, 80 (01):
  • [6] Interactive Micromanipulation of Picking and Placement of Nonconductive Microsphere in Scanning Electron Microscope
    Cao, Ning
    Xie, Shaorong
    Wu, Zhizheng
    Liu, Mei
    Li, Hengyu
    Pu, Huayan
    Luo, Jun
    Gong, Zhenbang
    MICROMACHINES, 2017, 8 (08) : 257
  • [7] Depth and Shape Estimation from Focus in Scanning Electron Microscope for Micromanipulation
    Marturi, Naresh
    Dembele, Sounkalo
    Piat, Nadine
    2013 INTERNATIONAL CONFERENCE ON CONTROL, AUTOMATION, ROBOTICS AND EMBEDDED SYSTEMS (CARE-2013), 2013,
  • [8] Automatic micromanipulation system using stereoscopic microscope
    Sano, T
    Nagahata, H
    Yamamoto, H
    IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, 1999, : 327 - 331
  • [9] Development of a microrobot-based micromanipulation cell in a scanning electron microscope (SEM)
    Schmoeckel, F
    Fahlbusch, S
    Seyfried, J
    Buerkle, A
    Fatikow, S
    MICROROBOTICS AND MICROASSEMBLY II, 2000, 4194 : 129 - 140
  • [10] Nanomanipulation System for Scanning Electron Microscope
    Woo, P.
    Mekuz, I.
    Chen, B.
    SCANNING MICROSCOPIES 2012: ADVANCED MICROSCOPY TECHNOLOGIES FOR DEFENSE, HOMELAND SECURITY, FORENSIC, LIFE, ENVIRONMENTAL, AND INDUSTRIAL SCIENCES, 2012, 8378