A sagittally focusing double-multilayer monochromator for ultrafast X-ray imaging applications

被引:17
|
作者
Wang, Yujie [1 ]
Narayanan, Suresh [1 ]
Liu, Jinyuan [1 ]
Shu, Deming [1 ]
Mashayekhi, Ali [1 ]
Qian, Jun [1 ]
Wang, Jin [1 ]
机构
[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
关键词
X-ray optics; sagittally focusing double-multilayer monochromator; X-ray radiography;
D O I
10.1107/S0909049506050205
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The development of a sagittally focusing double-multilayer monochromator is reported, which produces a spatially extended wide-bandpass X-ray beam from an intense synchrotron bending-magnet source at the Advanced Photon Source, for ultrafast X-ray radiography and tomography applications. This monochromator consists of two W/B4C multilayers with a 25 angstrom period coated on Si single-crystal substrates. The second multilayer is mounted on a sagittally focusing bender, which can dynamically change the bending radius of the multilayer in order to condense and focus the beam to various points along the beamline. With this new apparatus, it becomes possible to adjust the X-ray beam size to best match the area detector size and the object size to facilitate more efficient data collection using ultrafast X-ray radiography and tomography.
引用
收藏
页码:138 / 143
页数:6
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