Testing and programming flash memories on assemblies during high volume production

被引：0
|
作者：
de Jong, FGM [1 ]
Biewenga, AS [1 ]
van Geest, DCL [1 ]
Waayers, TF [1 ]
机构：
[1] Philips Res, NL-5656 AA Eindhoven, Netherlands
来源：
INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS | 2001年
关键词：
D O I：
10.1109/TEST.2001.966664
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Testing and programming flash memories is becoming increasingly important when producing high volumes Of assemblies. There is a growing trend to program the flash memories during board assembly by means of a tester, moving programming issues to the test department. Problematic is the relatively long time required for programming the flash devices in the production line. This is a strong driver for testing connectivity before programming. In order to reduce the programming time methods are discussed and a Fast Flash Controller (FFC) is presented which enables programming of flash memories close to their maximum programming speed.
引用
收藏
页码：470 / 479
页数：10
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