Synchrotron X-ray and ab initio studies Of β-Si3N4

被引：35

作者：

du Boulay, D

Ishizawa, N ^{[1
]}

Atake, T

Streltsov, V

Furuya, K

Munakata, F

机构：

[1] Nagoya Inst Technol, Ceram Res Lab, Asahigaoka, Tajimi 5070071, Japan

[2] Tokyo Inst Technol, Mat & Struct Lab, Midori Ku, Yokohama, Kanagawa 2268503, Japan

[3] CSIRO Hlth Sci & Nutr, Parkville, Vic 3052, Australia

[4] Seimi Chem Co Ltd, Chigasaki, Kanagawa 2538585, Japan

[5] Yokohama Natl Univ, Grad Sch Engn, Hodogaya Ku, Yokohama, Kanagawa 2408501, Japan

来源：

ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE CRYSTAL ENGINEERING AND MATERIALS | 2004年 / 60卷

关键词：

D O I：

10.1107/S010876810401393X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Almost absorption- and extinction-free single-crystal synchrotron X-ray diffraction data were measured at 150, 200 and 295 K for beta-Si3N4, silicon nitride, at a wavelength of 0.7 Angstrom. The true symmetry of this material has been the subject of minor controversy for several decades. No compelling evidence favouring the low-symmetry P6(3) model was identified in this study.

引用

页码：388 / 405

页数：18

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