Microwave dielectric characteristics of (1-x)(Al1/2Ta1/2)O2-xTiO2 ceramics

被引：3
|
作者：
Choi, JW [1 ]
Yoon, SJ
Kim, HJ
Yoon, KH
机构：
[1] Korea Inst Sci & Technol, Thin Film Technol Res Ctr, Seoul 130650, South Korea
[2] Yonsei Univ, Dept Ceram Engn, Seoul 120749, South Korea
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 6A期
关键词：
microwave dielectric materials; dielectric constant; quality factor; temperature coefficient of resonant frequency; tetragonal structure;
D O I：
10.1143/JJAP.41.3804
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The microwave and structural characteristics of (1 - x)(Al1/2Ta1/2)O-2-xTiO(2) (0 < x < 0.5) ceramics were investigated. (Al12Ta1/2)O-2 and TiO2 had orthorhombic and tetragonal structure. respectively, As TiO2 concentration increased, (1 - x)(Al1/2Ta1/2)O-2-xTiO(2) transformed to tetragonal structure. Specimens having a tetragonal single phase could he obtained for x greater than or equal to 0.15. As TiO2 concentration increased, the grain size. dielectric constant (epsilon(r)) significantly increased, and the temperature coefficient of resonant frequency (tau(f)) changed from negative to positive value. However. quality factor (Q) increased within limited values. A tau(f) of 0 ppm/degreesC was realized at x = 0.2 and the epsilon(r) and Q.f(0) value for this Composition were 29.4 and 75470 GHz, respectively. The relationship between microstructures and dielectric properties was also investigated.
引用
收藏
页码：3804 / 3807
页数：4
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