Semiconductor Manufacturing Equipment Data Acquisition Simulation for Timing Performance Analysis

被引:0
|
作者
Li-Baboud, Ya-Shian [1 ]
Zhu, Xiao [2 ]
Anand, Dhananjay [2 ]
Hussaini, Sulaiman [2 ]
Moyne, James [2 ]
机构
[1] Natl Inst Stand & Technol, Div Semicond Elect, Gaithersburg, MD 20899 USA
[2] Univ Michigan, Engn Res Ctr Reconfigurable Manufacturing Syst, Ann Arbor, MI 48109 USA
关键词
time synchronization; data acquisition; semiconductor manufacturing; data quality; Equipment Data Acquisition standard;
D O I
10.1109/ISPCS.2008.4659217
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The ability to acquire quality equipment and process data is important for future real-time process control systems to maximize opportunities for semiconductor manufacturing yield enhancement and equipment efficiency. Clock synchronization for accurate time-stamping and maintaining a consistent frequency in trace data collection are essential for accurate merging of data from heterogeneous sources. To characterize the factors impacting data collection synchronization and performance, a configurable fab-wide equipment data acquisition (EDA) simulator has been developed. By understanding the factors impacting clock synchronization and accurate time-stamping, the simulator is used to identify and explore methods to mitigate the latencies and provide guidance on accurate time-stamping for equipment data acquisition systems.
引用
收藏
页码:77 / +
页数:2
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