Sharper focal spot generated by 4π tight focusing of higher-order Laguerre-Gaussian radially polarized beam

被引：49
|
作者：
Chen, Gui-Yang [1 ,2 ]
Song, Feng [1 ,2 ]
Wang, Hui-Tian [1 ,2 ,3 ]
机构：
[1] Nankai Univ, Sch Phys, Tianjin 300071, Peoples R China
[2] Nankai Univ, MOE Key Lab Weak Light Nonlinear Photon, Tianjin 300071, Peoples R China
[3] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China
来源：
OPTICS LETTERS | 2013年 / 38卷 / 19期
基金：
中国国家自然科学基金;
关键词：
AXIAL RESOLUTION; LONG DEPTH; MODE BEAM; LIGHT; FIELD; MICROSCOPY; SYSTEM;
D O I：
10.1364/OL.38.003937
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The focal electric fields for a 4p high numerical aperture (NA) focusing system with both the doughnut and higher-order Laguerre-Gaussian (LG) radially polarized (RP) beams are investigated in the case of NA = 1, and the full width at half-maximum values of the focal spots are calculated. Compared with the single-lens high NA focusing configuration, a sharper spot, whose size is reduced efficiently in the transverse as well as the axial direction, can be formed. Such size reduction is attributed to not only the destruction interference of the longitudinal component caused by the p phase shift between any two adjacent rings of the incident higher-order LG RP beam coming from one particular direction but also the perfect destruction interference of the radial component formed by the two counter-propagating incident beams. (C) 2013 Optical Society of America
引用
收藏
页码：3937 / 3940
页数：4
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