A low-noise CMOS instrumentation amplifier for thermoelectric infrared detectors

被引:59
|
作者
Menolfi, C
Huang, QT
机构
[1] Integrated Systems Laboratory, Swiss Fed. Institute of Technology, Zurich
[2] Swiss Fed. Institute of Technology, Zurich
[3] Department of Precision Instruments, Harbin Institute of Technology
[4] Katholieke Universiteit Leuven, Department Elektrotechniek, ESAT Laboratories, Heverlee
[5] University of East Anglia, Norwich
[6] Integrated Systems Laboratory, Swiss Fed. Institute of Technology
关键词
chopper technique; CMOS infrared detector; instrumentation amplifier;
D O I
10.1109/4.597287
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A low-noise CMOS instrumentation amplifier for low-frequency thermoelectric infrared sensor applications is described which uses chopper technique to reduce low-frequency noise and offset, The offset reduction efficiency of the bandpass filter, implemented to reduce residual offset due to clock feedthrough, has been analyzed and experimentally verified. The circuit has been integrated in a transistor-only 1-mu m single-poly n-well CMOS process. It features a gain of 52 dB with a 500 Hz bandwidth and a common-mode rejection ratio (CMRR) of more than 70 dB. The equivalent input low frequency noise is 15 nV/root Hz. The typical residual input offset is 1.5 mu V. The amplifier power consumption is 1.3 mW.
引用
收藏
页码:968 / 976
页数:9
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