Single and double electron capture by fast Xe54+ from Kr and Xe

被引：0

作者：

Yu, Deyang ^{[1
]}

Shao, Caojie ^{[1
]}

Lu, Rongchun ^{[1
]}

Wang, Wei ^{[1
]}

Liu, Junliang ^{[1
]}

Xue, Yingli ^{[1
]}

Song, Zhangyong ^{[1
]}

Zhang, Mingwu ^{[1
]}

Yang, Bian ^{[1
]}

Ruan, Fangfang ^{[1
]}

Cai, Xiaohong ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China

来源：

XXIX INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC, AND ATOMIC COLLISIONS (ICPEAC2015), PTS 1-12 | 2015年 / 635卷

关键词：

COLLISIONS;

D O I：

10.1088/1742-6596/635/2/022083

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Decay X-ray spectrum of the scattered ions in 52-197 MeV/u Xe54+ collision with Kr and Xe atoms are measured. The transitions form the single capture ion Xe53+* and from the double capture ion Xe52+* are observed, both in a single collision. The single capture is the dominate channel at high energies while the double capture becomes dominate at lower energies.

引用

页数：1

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