Science Opportunities at the SwissFEL X-ray Laser

被引：14
|
作者：
Patterson, Bruce D. [1 ]
Beaud, Paul [1 ]
Braun, Hans H. [1 ]
Dejoie, Catherine [1 ,2 ]
Ingold, Gerhard [1 ]
Milne, Christopher [1 ]
Patthey, Luc [1 ]
Pedrini, Bill [1 ]
Szlachentko, Jakub [1 ]
Abela, Rafael [1 ]
机构：
[1] Paul Scherrer Inst, SwissFEL, CH-5232 Villigen, Switzerland
[2] Swiss Fed Inst Technol, Lab Kristallog, CH-8093 Zurich, Switzerland
来源：
CHIMIA | 2014年 / 68卷 / 1-2期
关键词：
Cross correlations; Free electron laser; Photochemistry; Pump and probe experiments; Single shot spectroscopy; X-ray diffraction; SPECTROSCOPY; SCATTERING; ELECTRON;
D O I：
10.2533/chimia.2014.73
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude higher than that of a synchrotron. These pulses will allow studies of femtosecond dynamics at nanometer resolution and with chemical selectivity. They will produce diffraction images of organic and inorganic nanostructures without deleterious effects of radiation damage.
引用
收藏
页码：73 / 78
页数：6
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