Frequency-comb-referenced two-wavelength source for absolute distance measurement

被引:154
|
作者
Schuhler, Nicolas
Salvade, Yves
Leveque, Samuel
Daendliker, Rene
Holzwarth, Ronald
机构
[1] Lab Syst Photon, F-67400 Illkirch Graffenstaden, France
[2] European So Observ, D-85748 Garching, Germany
[3] Haute Ecole ARC Ingn, CH-2610 St Imier, Switzerland
[4] Univ Neuchatel, Inst Microtech, CH-2000 Neuchatel, Switzerland
[5] Menlo Syst GmbH, D-82152 Martinsried, Germany
关键词
D O I
10.1364/OL.31.003101
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We propose a new tunable laser source concept for multiple-wavelength interferometry, offering an unprecedented large choice of synthetic wavelengths with a relative uncertainty better than 10(-11) in vacuum. Two lasers are frequency stabilized over a wide range of frequency intervals defined by the frequency comb generated by a mode-locked fiber laser. In addition, we present experimental results demonstrating the generation of a 90 Am synthetic wavelength calibrated with an accuracy better than 0.2 parts in 10(6). With this synthetic wavelength we can resolve one optical wavelength, which opens the way to absolute distance measurement with nanometer accuracy. (c) 2006 Optical Society of America.
引用
收藏
页码:3101 / 3103
页数:3
相关论文
共 50 条
  • [1] Absolute distance measurement using frequency-comb-referenced four-wavelength interferometry
    Wang, Guochao
    Jang, Yoon-Soo
    Kang, Hyunjay
    Chun, Byung Jae
    Kim, Young-Jin
    Kim, Seung-Woo
    NINTH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION, 2015, 9446
  • [2] Real-Time and Meter-Scale Absolute Distance Measurement by Frequency-Comb-Referenced Multi-Wavelength Interferometry
    Wang, Guochao
    Tan, Lilong
    Yan, Shuhua
    SENSORS, 2018, 18 (02):
  • [3] High-accuracy absolute distance measurement using frequency comb referenced multiwavelength source
    Salvade, Yves
    Schuhler, Nicolas
    Leveque, Samuel
    Le Floch, Sebastien
    APPLIED OPTICS, 2008, 47 (14) : 2715 - 2720
  • [4] Absolute distance interferometry with two-wavelength fringe visibility measurement
    Golubev, AN
    Chekhovsky, AM
    OPTICAL ENGINEERING, 1997, 36 (08) : 2229 - 2232
  • [5] Frequency-comb-referenced multi-wavelength profilometry for largely stepped surfaces
    Hyun, Sangwon
    Choi, Minah
    Chun, Byung Jae
    Kim, Seungman
    Kim, Seung-Woo
    Kim, Young-Jin
    OPTICS EXPRESS, 2013, 21 (08): : 9780 - 9791
  • [6] Superheterodyne configuration for two-wavelength interferometry applied to absolute distance measurement
    Le Floch, Sebastien
    Salvade, Yves
    Droz, Nathalie
    Mitouassiwou, Rostand
    Favre, Patrick
    APPLIED OPTICS, 2010, 49 (04) : 714 - 717
  • [7] Synthetic wavelength interferometry of an optical frequency comb for absolute distance measurement
    Wu, Guanhao
    Liao, Lei
    Xiong, Shilin
    Li, Guoyuan
    Cai, Zhijian
    Zhu, Zebin
    SCIENTIFIC REPORTS, 2018, 8
  • [8] Synthetic wavelength interferometry of an optical frequency comb for absolute distance measurement
    Guanhao Wu
    Lei Liao
    Shilin Xiong
    Guoyuan Li
    Zhijian Cai
    Zebin Zhu
    Scientific Reports, 8
  • [9] Frequency-comb-referenced mid-infrared source for high-precision spectroscopy
    Peltola, Jari
    Vainio, Markku
    Fordell, Thomas
    Hieta, Tuomas
    Merimaa, Mikko
    Halonen, Lauri
    OPTICS EXPRESS, 2014, 22 (26): : 32429 - 32439
  • [10] Plasmonic dynamics measured with frequency-comb-referenced phase spectroscopy
    Nguyen Duy Anh
    Chun, Byung Jae
    Choi, Sungho
    Kim, Dong-Eon
    Kim, Seungchul
    Kim, Young-Jin
    NATURE PHYSICS, 2019, 15 (02) : 132 - +