Reliability equivalence of independent and non-identical components series systems

被引：28

作者：

Sarhan, A ^{[1
]}

机构：

[1] Mansoura Univ, Dept Math, Mansoura 35516, Egypt

来源：

RELIABILITY ENGINEERING & SYSTEM SAFETY | 2000年 / 67卷 / 03期

关键词：

imperfect switch method; cold duplication method; warm reliability equivalence factor;

D O I：

10.1016/S0951-8320(99)00069-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper is devoted to obtain the reliability equivalence factors of n independent and non-identical components series system. The lifetime of each component is assumed to be exponentially distributed random variable. The results introduced by Rade [Rade L. Reliability equivalence. Microelectronics and Reliability 1993a;33:323-5; Rade L, Reliability survival equivalence. Microelectronics and Reliability 1993b;33:881-94.] can be obtained as special cases from this work when n = 1.2 and assuming the components are identical. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：293 / 300

页数：8

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