SEM-EDS nanoleakage evaluation of universal-adhesive-systems with etch-and-rinse and self-etch approach

被引：0
|
作者：
Certan, Mihai [1 ]
Polido, Maria [1 ,2 ]
Brito, Jose [1 ,2 ]
Azul, Ana Cristina [1 ,2 ]
机构：
[1] IUEM, Caparica, Portugal
[2] CiiEM, Caparica, Portugal
来源：
ANNALS OF MEDICINE | 2019年 / 51卷
关键词：
PERFORMANCE;
D O I：
10.1080/07853890.2018.1562697
中图分类号：
R5 [内科学];
学科分类号：
1002 ; 100201 ;
摘要：
引用
收藏
页码：S97 / S97
页数：1
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