Femtosecond Two-Photon Detachment of Cu- Studied By Photoelectron Imaging

被引：0
|
作者：
Liu, Ben-kang [1 ]
Wang, Yan-qiu [1 ]
Wang, Li [1 ]
机构：
[1] Chinese Acad Sci, Dalian Inst Chem Phys, Dalian 116023, Peoples R China
来源：
CHINESE JOURNAL OF CHEMICAL PHYSICS | 2014年 / 27卷 / 02期
基金：
中国国家自然科学基金;
关键词：
Femtosecond; Two-photon detachment; Photoelectron velocity imaging; Cu-; ABOVE-THRESHOLD IONIZATION; EXCESS-PHOTON DETACHMENT; NEGATIVE-IONS; ANGULAR-DISTRIBUTIONS; CLUSTER ANIONS; ELECTRONS; PHOTODETACHMENT; DYNAMICS; FIELD;
D O I：
10.1063/1674-0068/27/02/125-130
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
The wavelength dependence of photoelectron angular distributions (PADs) of two-photon detachment of Cu-has been directly studied by using the photoelectron map imaging. Results show that for the laser field intensity of 6.0 x10(10) W/cm(2), PADs exhibit dramatic change with the external field wavelength. Comparison between the experimental observation and the lowest-order perturbation theory prediction indicates that the pattern of PADs can be explained by the interference of the s and d partial waves in the final state. Relative contributions of s and d partial waves in the two-photon detachment at different laser wavelengths are obtained.
引用
收藏
页码：125 / 130
页数：6
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