Thermal-Dependent Nonvolatile Memory Characteristics Based on Organic Ferroelectric Field-Effect Transistor

被引:1
|
作者
Kim, Won-Ho [1 ]
Choi, Yoonseuk [2 ]
Bae, Jin-Hyuk [3 ]
机构
[1] Samsung Display Co Ltd, LCD Div, LCD R&D Ctr, Gyeonggi Do 446711, South Korea
[2] Hanbat Natl Univ, Dept Elect, Taejon 305719, South Korea
[3] Kyungpook Natl Univ, Sch Elect Engn, Taegu 702701, South Korea
关键词
Thermal Stability; Nonvolatile Memory; OFeFET; P(VDF-TrFE); Phase Transition; FLUORIDE TRIFLUOROETHYLENE COPOLYMERS; THIN-FILMS; TEMPERATURE; TRANSITION;
D O I
10.1166/jnn.2013.7627
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A We report on the thermal stability of nonvolatile memory characteristics in an organic ferroelectric field-effect transistor (OFeFET) with a ferroelectric polymer of poly(vinylidene fluoride-trifluoroethylene)[P(VDF-TrFE)]. Pentacene-based OFeFETs are thermally annealed to understand how the thermal treatment affects nonvolatile memory characteristics. As increasing the annealing temperature up to 80 degrees C, both the memory window and the memory on-off ratio show no significant difference, while the memory properties results in rather monotonic reduction for beyond 80 degrees C which corresponds to the phase transition temperature of P(VDF-TrFE) molecules. It was found that the phase transition of the P(VDF-TrFE) from ferroelectric beta-phase to paraelectric gamma-phase at Curie's temperature plays a critical role for tailoring the electric characteristics in OFeFETs.
引用
收藏
页码:7080 / 7082
页数:3
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