Wideband Micromagnetic Multi-parameter Materials Characterization with 3MA

被引:0
|
作者
Mironenko, Ivan [1 ]
Szielasko, Klaus [1 ]
Kiselmann, Ifrit [5 ]
Kopp, Harald [2 ]
Kopp, Melanie [1 ]
Altpeter, Iris [1 ]
Dobmann, Gerd [3 ]
Boller, Christian [4 ]
机构
[1] Fraunhofer IZFP, Dept Mat Characterizat Flaw Detect & Life Cycle M, D-66123 Saarbrucken, Germany
[2] Fraunhofer IZFP, Dept Proc, D-66123 Saarbrucken, Germany
[3] Fraunhofer IZFP, Sci, D-66123 Saarbrucken, Germany
[4] Fraunhofer IZFP, Inst, D-66123 Saarbrucken, Germany
[5] EXECT Kiselmann Hard & Software, Blieskastel Altheim, Germany
关键词
3MA; Barkhausen noise; filter banks; spectrum analysis;
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The frequency-dependent penetration depth ("skin effect") of the electromagnetic field in electrically conductive materials is a well-known phenomenon. When applying this to micromagnetic testing, it becomes possible to control the depth of the characterized volume through variation of the excitation and analysis frequencies. In the case of IZFP's Micromagnetic Multi-parameter Microstructure and Stress Analysis method (3MA), the magnetizing frequency, the Barkhausen noise analysis frequency range and the eddy current testing frequencies may be varied. Applications such as the nondestructive detection and quantitative description of grinding damage via depth gradients of the hardness, residual stress and retained austenite percentage, have already been demonstrated lately. In order to further explore the frequency-domain information, raw wideband signals of all magnetic measured quantities are required. IZFP has developed a new generation of 3MA testing devices which allows us to excite the material with arbitrary waveforms in the frequency range of 0 Hz to 10 MHz and to record all relevant magnetic quantities with a 40 MSamples/s, multichannel, 14-bit A/D converter attached to an FPGA which performs most of the digital signal processing in real-time. This paper discusses the results obtained with this system on the example of samples with surface-near gradients. New analysis methods are proposed which are expected to increase the interpretability and repeatability of the measurements significantly.
引用
收藏
页码:65 / 75
页数:11
相关论文
共 50 条
  • [1] Quantitative eddy current variants for micromagnetic microstructure multiparameter analysis (3MA)
    Dobmann, Gerd
    Becker, Rainer
    Rodner, Christoph
    Review of Progress in Quantitative Nondestructive Evaluation, 1988, 7 B : 1703 - 1707
  • [2] PHYSICAL BASICS AND INDUSTRIAL APPLICATIONS OF 3MA MICROMAGNETIC MULTIPARAMETER MICROSTRUCTURE AND STRESS ANALYSIS
    DOBMANN, Gerd
    10TH EUROPEAN CONFERENCE ON NON-DESTRUCTIVE TESTING 2010 (ECNDT), VOLS 1-5, 2010, : 11 - 22
  • [3] Multi-Parameter Analysis of Textile Materials
    Peng Y.
    Min Y.
    Dang W.
    Shi H.
    Liu Z.
    Textile and Leather Review, 2024, 7 : 203 - 221
  • [4] MULTI-PARAMETER OPTIMIZATION AND ENERGY ESTIMATES FOR WIDEBAND PIEZOELECTRIC TRANSDUCERS
    KASATKIN, BA
    PAVIN, NY
    SOVIET PHYSICS ACOUSTICS-USSR, 1980, 26 (05): : 407 - 410
  • [6] ABSTRACT MULTI-PARAMETER THEORY .3.
    BROWNE, PJ
    JOURNAL OF MATHEMATICAL ANALYSIS AND APPLICATIONS, 1980, 73 (02) : 561 - 567
  • [7] Characterization of a multi-parameter sensor for continuous wound assessment
    Puchberger-Enengl, Dietmar
    Krutzler, Christian
    Binder, Michael
    Rohrer, Christian
    Schroeder, Klaus Rudolf
    Keplinger, Franz
    Vellekoop, Michael J.
    26TH EUROPEAN CONFERENCE ON SOLID-STATE TRANSDUCERS, EUROSENSOR 2012, 2012, 47 : 985 - 988
  • [8] Characterization of Optical System for Hemodynamic Multi-Parameter Assessment
    Pereira T.
    Santos I.
    Oliveira T.
    Vaz P.
    Correia T.
    Pereira T.
    Santos H.
    Pereira H.
    Almeida V.
    Cardoso J.
    Correia C.
    Pereira, T. (taniapereira@lei.fis.uc.pt), 1600, Springer Science and Business Media, LLC (04): : 87 - 97
  • [9] Multi-parameter RF based Characterization of Nanoparticles and Biomolecules
    Mazumder, Annesha
    Azeemuddin, Syed
    Sau, Tapan K.
    Bhimalapuram, Prabhakar
    Biswas, Arunangshu
    2022 IEEE 22ND INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (NANO), 2022, : 157 - 160
  • [10] Multi-parameter AFM characterization of INS-1 cells
    Yang, Fan
    Wang, Bowei
    Wang, Jiajia
    Chen, Yujuan
    Wang, Zuobin
    2021 IEEE INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO), 2021, : 152 - 155