Imaging of surface acoustic waves

被引：0

作者：

Bödefeld, C ^{[1
]}

Beil, F ^{[1
]}

Kutschera, HJ ^{[1
]}

Streibl, M ^{[1
]}

Wixforth, A ^{[1
]}

机构：

[1] Univ Munich, Sekt Phys, D-80539 Munich, Germany

来源：

2001 IEEE ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1 AND 2 | 2001年

关键词：

D O I：

暂无

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

A new method to optically examine surface acoustic wave (SAW) propagation on a semiconductor chip is presented. This visualization method is based on the influence of a SAW on the optical properties of a piezoelectric semiconductor. There are two interaction mechanisms between the SAW and photo generated carriers that allow to correlate the photoluminescence (PL) to the power of the SAW: First exciton dissociation leads to a reduction of the PL and second trapped charge carriers can be released leading to an enhancement of the PL. In the experiment we use a gated and intensified CCD camera to directly record light coming from the sample. With our setup we are able to display the temporal and spatial distribution of SAW fields with a resolution of 300 ps and 1 mum respectively.

引用

页码：145 / 148

页数：4

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