Method of determination of a volume fraction of a crystalline phase in amorphous-crystalline materials

The method for determination of volume fraction of crystalline phase in amorphous-crystalline materials is proposed. The method is based on the analysis of X-ray patterns obtained under a study of structure-phase changes in the nanocrystalline alloys of Finemet-type. Verification of the method is carried out with the use of X-ray diffraction data (including small-angle scattering) for specimens in as-quenched amorphous state as well as after various temperatures of annealing, which provided the formation and growth of crystals in amorphous matrix within the sizes' range front 2 to 15 nm. The method is the most effective under nanocrystals' size exceeding 5-6 nm, when their further increase does not influence an the height and width of diffraction reflexes.