High-energy resolution PIXE study of heat induced changes in cadmium compounds using ion microbeam

被引：0
|
作者：
Tadic, T
Mokuno, Y
Horino, Y
Jaksic, M
Desnica, ID
Trojko, R
机构：
[1] Rudjer Boskovic Inst, HR-10001 Zagreb, Croatia
[2] Osaka Natl Res Inst, Ikeda, Osaka 563857, Japan
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1999年 / 158卷 / 1-4期
关键词：
ion microbeam; high-resolution PIXE; chemical effects; cadmium;
D O I：
10.1016/S0168-583X(99)00320-1
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The intensity changes of the satellite X-ray line spectra can be related to the changes in the chemical environment of atoms in the sample. High-energy resolution PIXE analysis of chemical effects in X-ray spectra of Cd L lines was applied in studies of heat-treated CdS and CdTe cadmium compounds. The applicability of the method for monitoring crystal phases and chemical states in these and other materials using ion microbeam with high energy resolution PIXE spectrometer is discussed. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：241 / 244
页数：4
相关论文
共 50 条
  • [1] High energy resolution PIXE with high efficiency using the heavy ion microbeam
    Mokuno, Y
    Horino, Y
    Chayahara, A
    Kinomura, A
    Tsubouchi, N
    Fujii, K
    Terasawa, M
    Sekioka, T
    Mitamura, T
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 130 (1-4): : 243 - 246
  • [2] Optimization of an rf ion source for production of a high-energy ion microbeam
    Kalinichenko, A
    Khomenko, V
    Lebed, S
    Mordik, S
    Voznij, V
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 122 (02): : 274 - 277
  • [3] High-energy PIXE using 68 MeV protons
    Denker, A
    Maier, KH
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 150 (1-4): : 118 - 123
  • [4] High energy resolution PIXE analysis using focused MeV heavy ion beams
    Mokuno, Y
    Horino, Y
    Tadic, T
    Terasawa, M
    Sekioka, T
    Chayahara, A
    Kinomura, A
    Tsubouchi, N
    Fujii, K
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 136 : 368 - 372
  • [5] ION-BEAMS WITH HIGH-ENERGY RESOLUTION
    GORRES, J
    ROLFS, C
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1985, 236 (01): : 203 - 205
  • [6] Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron
    Oikawa, Masakazu
    Satoh, Takahiro
    Sakai, Takuro
    Miyawaki, Nobumasa
    Kashiwagi, Hirotsugu
    Kurashima, Satoshi
    Okumura, Susumu
    Fukuda, Mitsuhiro
    Yokota, Watalu
    Kamiya, Tomihiro
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 260 (01): : 85 - 90
  • [7] INTERFACE OBSERVATION USING MEDIUM ENERGY ION-SCATTERING WITH HIGH-ENERGY RESOLUTION
    KOSHIKAWA, T
    KIKUCHI, R
    TAKAGI, K
    UCHIYAMA, T
    MIHARA, Y
    AGAWA, Y
    MATSUURA, S
    INUZUKA, E
    SUZUKI, T
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 33 (1-4): : 623 - 627
  • [8] Live cell imaging combined with high-energy single-ion microbeam
    Guo, Na
    Du, Guanghua
    Liu, Wenjing
    Guo, Jinlong
    Wu, Ruqun
    Chen, Hao
    Wei, Junzhe
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2016, 87 (03):
  • [9] CEREBRAL HIGH-ENERGY COMPOUNDS - CHANGES IN ANOXIA
    LOLLEY, RN
    SAMSON, FE
    [J]. AMERICAN JOURNAL OF PHYSIOLOGY, 1962, 202 (01): : 77 - &
  • [10] SILICON PLANAR ION DETECTORS WITH HIGH-ENERGY RESOLUTION
    VERBITSKAYA, EM
    EREMIN, VK
    MALYARENKO, AM
    STROKAN, NB
    SUKHANOV, VL
    BORANI, I
    SCHMIDT, B
    [J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1991, 34 (03) : 534 - 539
12345