Single-event effects in resolver-to-digital converters

被引：15
|
作者：
Buchner, S [1 ]
Tran, L
Mann, J
Turflinger, T
McMorrow, D
Campbell, A
Dozier, C
机构：
[1] USN, Res Lab, Washington, DC 20375 USA
[2] SFA Inc, Largo, MD 20774 USA
[3] NSWC, Crane, IN 47401 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1999年 / 46卷 / 06期
关键词：
D O I：
10.1109/23.819106
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Single-event effects (SEE's) in two resolver-to-digital converters (RDC's) have been studied using heavy ions and pulsed laser light. The important role of the pulsed laser in establishing single-event upset (SEU) and single-event latchup (SEL) levels prior to accelerator testing is described, as is its role in evaluating the test software and hardware and in gaining a better understanding of the origins of the SEE's. Results from pulsed-laser testing are in quantitative agreement with those from heavy-ion testing: the RDC-19220 is sensitive to both SEU's and SEL's whereas the AD2S80 is less sensitive to SEU's and immune to SEL.
引用
收藏
页码：1445 / 1452
页数：8
相关论文
共 50 条
  • [1] Tracking Amplitude Resolver-to-Digital Converters
    Smirnov, Y. S.
    Yurasova, E. V.
    Safronov, V. V.
    2016 2ND INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING, APPLICATIONS AND MANUFACTURING (ICIEAM), 2016,
  • [2] A Composite Observer for Resolver-to-Digital Conversion
    Ang, Gao
    Zhong, Wu
    ISTAI 2016: PROCEEDINGS OF THE SIXTH INTERNATIONAL SYMPOSIUM ON TEST AUTOMATION & INSTRUMENTATION, 2016, : 188 - 193
  • [3] A low cost resolver-to-digital converter
    Attaianese, C
    Tomasso, G
    De Bonis, D
    IEMDC 2001: IEEE INTERNATIONAL ELECTRIC MACHINES AND DRIVES CONFERENCE, 2001, : 917 - 921
  • [4] TECHNIQUES FOR IMPROVING RESOLVER-TO-DIGITAL CONVERSION ACCURACY
    HANSELMAN, DC
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 1991, 38 (06) : 501 - 504
  • [5] New class K resolver-to-digital converter
    不详
    AIRCRAFT ENGINEERING AND AEROSPACE TECHNOLOGY, 2004, 76 (02): : 264 - 265
  • [6] Implementation of resolver excitation and resolver-to-digital conversion system based on DSP
    Xu Xiangbo
    Fang Jiancheng
    7TH INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION AND CONTROL TECHNOLOGY: MEASUREMENT THEORY AND SYSTEMS AND AERONAUTICAL EQUIPMENT, 2008, 7128
  • [7] Resolver-to-digital Converter Based on Tangent Algorithm
    Han, Zhuangzhi
    Zhang, Heng
    He, Qiang
    Shang, Chaoxuan
    ISIE: 2009 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, 2009, : 329 - 332
  • [8] Composite state observer for resolver-to-digital conversion
    Zhang, Jian
    Wu, Zhong
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2017, 28 (06)
  • [9] Integrally Accurate Resolver-to-Digital Converter (RDC)
    Ismail, Nordinah
    Kobayashi, Fuminori
    Inoue, Manabu
    2015 10TH ASIAN CONTROL CONFERENCE (ASCC), 2015,
  • [10] RESOLVER SIGNAL REQUIREMENTS FOR HIGH-ACCURACY RESOLVER-TO-DIGITAL CONVERSION
    HANSELMAN, D
    IECON 89, VOLS 1-4: POWER ELECTRONICS - SIGNAL-PROCESSING & SIGNAL CONTROL - FACTORY AUTOMATION, EMERGING TECHNOLOGIES, 1989, : 486 - 493
12345