CSCC for mean of an inverse Gaussian distribution under type I censoring

被引：2
|
作者：
Shankar, G
Joseph, S
机构：
[1] Pt. Ravishankar Shukla University, Raipur (M.P.)
来源：
MICROELECTRONICS AND RELIABILITY | 1996年 / 36卷 / 09期
关键词：
D O I：
10.1016/0026-2714(95)00150-6
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper Cumulative Sum Control Chart (CSCC) have been constructed for the mean of Inverse Gaussian distributed life test data. The parameters of the V-mask have been determined and finally the expression for the Average Run Length has been derived and illustrated numerically. Copyright (C) 1996 Elsevier Science Ltd.
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页码：1309 / 1311
页数：3
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