Near-field electromagnetic tomography

被引:0
|
作者
Gaikovich, K. P. [1 ]
机构
[1] RAS, Inst Phys Microstruct, Nizhnii Novgorod 603950, Russia
关键词
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new method of the electromagnetic tomography that uses data of the 2-dimensional (2D) scanning of an inhomogeneous half-space along its plane interface has been worked out. Signal parameters should be measured in dependence on a parameter of the received signal that determines the effective depth of its formation. This method is based on the solution of 3D integral equation. The application of this method to the passive and active microwave sounding has been considered, as well as the possibility of its application in the scanning near-field optical microscopy.
引用
收藏
页码:141 / 143
页数:3
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