Preparation and structural characterization of thin-film CdTe/CdS heterojunctions

被引：0
|
作者：
Salaoru, I.
Buffat, P. A.
Laub, D.
Amariei, A.
Apetroaei, N.
Rusu, M.
机构：
[1] Al I Cuza Univ, Iasi 700506, Romania
[2] EPFL, CIME, Lausanne, Switzerland
来源：
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2006年 / 8卷 / 03期
关键词：
CdTe; CdS; thin films; heterojunctions; structural properties;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The structural characteristics of CdTe/CdS thin-film heterojunctions are investigated. The studied heterojunctions were obtained by successive thermal evaporation under vacuum onto unheated SnO2 coated glass substrates of CdS and CdTe films, respectively. The morphological and structural studies of the above mentioned heterojunction component films, in comparison with those of CdS and CdTe films, deposited separately, onto glass substrates, were carried out using transmission electron microscopy, X-ray diffraction and atomic force microscopy techniques.
引用
收藏
页码：936 / 940
页数：5
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