Raman spectroscopy of bulk and thin-layer (Ba,Sr)TiO3 ferroelectrics

被引：25
|
作者：
Katiyar, RS [1 ]
Jain, M [1 ]
Yuzyuk, YI [1 ]
机构：
[1] Univ Puerto Rico, Dept Phys, Rio Piedras, PR 00931 USA
来源：
FERROELECTRICS | 2004年 / 303卷
关键词：
Raman spectroscopy; soft mode; thin films;
D O I：
10.1080/00150190490452857
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A comparative Raman study of (Ba,Sr)TO3 bulk ceramics, sol-gel derived polycrystalline thin film, and heteroepitaxial thin film deposited by rf sputtering onto (001) MgO substrate is reported. It is found that phase transition sequence in the heteroepitaxial thin film is markedly different from those observed in the bulk ceramics and polycrystalline thin film.
引用
收藏
页码：101 / 105
页数：5
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