Multi-functional probe recording: Field-induced recording and near-field optical readout

被引：0

作者：

Park, KH ^{[1
]}

Kim, J ^{[1
]}

Song, KB ^{[1
]}

Lee, SQ ^{[1
]}

Kim, J ^{[1
]}

Kim, EK ^{[1
]}

机构：

[1] ETRI, Basic Res Lab, Taejon, South Korea

来源：

ETRI JOURNAL | 2004年 / 26卷 / 03期

关键词：

atomic force microscope (AEM); near-field scanning optical microscope (NSOM); probe; high speed recording; near-field optical readout;

D O I：

10.4218/etrij.04.0103.0063

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We demonstrate a high-speed recording based on field-induced manipulation in combination with an optical reading of recorded bits on An cluster films using the atomic force microscope (AFM) and the near-field scanning optical microscope (NSOM). We reproduced 50 nm-sized mounds by applying short electrical pulses to conducting tips in a non-contact mode as a writing process. The recorded marks were then optically read using bent fiber probes in a transmission mode. A strong enhancement of light transmission is attributed to the local surface plasmon excitation on the protruded dots.

引用

页码：189 / 194

页数：6

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