Transparent conducting In2O3 thin films prepared by ultrasonic spray pyrolysis

被引：35

作者：

Lee, JH ^{[1
]}

Park, BO ^{[1
]}

机构：

[1] Kyungpook Natl Univ, Dept Inorgan Mat Engn, Taegu 702701, South Korea

来源：

SURFACE & COATINGS TECHNOLOGY | 2004年 / 184卷 / 01期

关键词：

indium oxide; thermal spraying; X-ray diffraction; scanning electron microscopy; resistivity; UV-VIS-NIR spectrophotometer;

D O I：

10.1016/j.surfcoat.2003.10.015

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Indium oxide (In2O3) thin films have been prepared by the spray pyrolysis method. The effect of a deposit temperature and a deposit time on the electrical and optical properties of films has been investigated to obtain highly conductive transparent In2O3 thin films. Bare glass was used as a substrate and oxygen as the carrier and reaction gas. X-Ray diffraction (XRD) patterns showed that films were polycrystalline and that their crystallinities were proportional to deposit time and deposit temperature. A difference in surface morphology was observed in the films according to deposit temperature using scanning electron microscopy (SEM). The minimum resistivity value was 4.34 x 10(-3) Omega cm in the films deposited at 500 degreesC for 90 min, whose carrier concentration and Hall mobility were 1.057 x 10(20) cm(-3) and 14.783 cm(2)/V s, respectively. In addition, the optical transmittance of films were approximately 87.5% in the visible range. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：102 / 107

页数：6

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