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- [2] Distinct correlation between CeO2 and YSZ in out-of-plane and in-plane mosaic dispersions of heteroepitaxial CeO2/YSZ/Si(001) films [J]. Applied Physics A, 2002, 74 : 693 - 697
- [3] Distinct correlation between CeO2 and YSZ in out-of-plane and in-plane mosaic dispersions of heteroepitaxial CeO2/YSZ/Si(001) films [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2002, 74 (05): : 693 - 697
- [5] Characterization of defect type and dislocation density in double oxide heteroepitaxial CeO2/YSZ/Si(001) films [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2003, 76 (06): : 969 - 973
- [6] Characterization of defect type and dislocation density in double oxide heteroepitaxial CeO2/YSZ/Si(001) films [J]. Applied Physics A, 2003, 76 : 969 - 973
- [7] Improvement of capacitance-voltage (C-V) characteristics of YSZ/Si(001) and ZrO2/Si thin film by Nb-doping [J]. NOVEL MATERIALS AND PROCESSES FOR ADVANCED CMOS, 2003, 745 : 343 - 348
- [8] Improvement of capacitance-voltage (C-V) characteristics of YSZ/Si(001) and ZrO2/Si thin film by Nb-doping [J]. CRYSTALLINE OXIDE-SILICON HETEROSTRUCTURES AND OXIDE OPTOELECTRONICS, 2003, 747 : 153 - 158