X-ray microtomographic imaging and analysis for basic research

被引:10
|
作者
Dunsmuir, J. H. [1 ]
Bennett, S. [1 ]
Fareria, L. [1 ]
Mingino, A. [1 ]
Sansone, M. [1 ]
机构
[1] ExxonMobil Res & Engn Co, Corp Strateg Res, Annandale, NJ 08801 USA
关键词
D O I
10.1154/1.2204956
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
For research facilities with access to synchrotron X-ray sources, X-ray absorption microtomography (XMT) has evolved from an experimental imaging method to a specialized, if not yet routine, microscopy for imaging the three-dimensional (3D) distribution of linear attenuation coefficients and, in some cases, elemental concentration with micron spatial resolution. Recent advances in source and detector design have produced conventional X-ray source instruments with comparable spatial resolution but with lower throughput and without element specific imaging. Both classes of instrument produce 3D images for analysis. We discuss an integrated approach for the implementation of analytical XMT to support basic research into the structure-property relationships of a variety of materials. The essential components include. instrumentation for collecting quantitative 3D images, a 3D image processing environment to address questions as to the quantity, composition, geometry, and relationships among the features in one or more images, and visualization to provide insight and communicate results. We give examples of image analysis of resolved and unresolved pore spaces of sandstones. (c) 2006 International Centre for Diffraction Data.
引用
收藏
页码:125 / 131
页数:7
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