Structural contribution to the ferroelectric fatigue in lead zirconate titanate ceramics

被引:28
|
作者
Hinterstein, M. [1 ,2 ]
Rouquette, J. [3 ]
Haines, J. [3 ]
Papet, Ph. [3 ]
Glaum, J. [1 ]
Knapp, M. [2 ]
Eckert, J. [4 ]
Hoffman, M. [1 ]
机构
[1] Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia
[2] Karlsruher Inst Technol, Inst Angew Mat Energiespeichersyst, D-76344 Eggenstein Leopoldshafen, Germany
[3] Univ Montpellier 2, Inst Charles Gerhardt, UMR CNRS 5253, Equipe C2M, F-34095 Montpellier 5, France
[4] Tech Univ Dresden, Inst Werkstoffwissensch, D-01062 Dresden, Germany
来源
PHYSICAL REVIEW B | 2014年 / 90卷 / 09期
关键词
X-RAY-DIFFRACTION; POLARIZATION FATIGUE; THIN-FILMS; CAPACITORS; SCENARIOS; MODEL;
D O I
10.1103/PhysRevB.90.094113
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Many ferroelectric devices are based on doped lead zirconate titanate (PZT) ceramics with compositions near the morphotropic phase boundary (MPB), at which the relevant material's properties approach their maximum. Based on a synchrotron x-ray diffraction study of MPB PZT, bulk fatigue is unambiguously found to arise from a less effective field induced tetragonal-to-monoclinic transformation, at which the degradation of the polarization flipping is detected by a less intense and more diffuse anomaly in the atomic displacement parameter of lead. The time dependence of the ferroelectric response on a structural level down to 250 mu s confirms this interpretation in the time scale of the piezolectric strain response.
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页数:7
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