Wavelength tuning of InAs/InP quantum dots:: Control of As/P surface exchange reaction

被引:1
|
作者
Notzel, R.
Anantathanasarn, S.
van Veldhoven, P. J.
van Otten, F. W. M.
Eijkemans, T. J.
Trampert, A.
Satpati, B.
Wolter, J. H.
机构
[1] Eindhoven Univ Technol, eiTT, COBRA Interuniv Res Inst, NL-5600 MB Eindhoven, Netherlands
[2] Paul Drude Inst Festkorperelekt, D-10117 Berlin, Germany
来源
关键词
D O I
10.1116/1.2216719
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
InGaAsP/InP (100) grown by metal organic vapor-phase epitaxy is achieved by controlling the As/P surface exchange reaction during InAs deposition. The As/P exchange reaction is suppressed for decreased QD growth temperature and group V-III flow ratio, reducing the QD size and photoluminescence (PL) emission wavelength. The As/P exchange reaction and QD PL wavelength are then reproducibly controlled by the thickness of an ultrathin (0-2 ML) GaAs interlayer underneath the QDs. Submonolayer GaAs coverages result in a shape transition from QDs to quantum dashes at low group V-III flow ratio. Temperature dependent PL measurements reveal excellent optical properties of the QDs up to room temperature with PL peak wavelengths in the technologically important 1.55 mu m region for telecom applications. Widely stacked QD layers are reproduced with identical PL emission to increase the active volume, while closely stacked QD layers reveal a systematic PL redshift and linewidth reduction due to vertical electronic coupling which is proven by the linear polarization of the cleaved-side PL changing from in plane to isotropic. (c) 2006 American Vacuum Society.
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页码:2075 / 2079
页数:5
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