Machine-Learning-Based Read Reference Voltage Estimation for NAND Flash Memory Systems Without Knowledge of Retention Time

被引:12
|
作者
Choe, Hyemin [1 ]
Jee, Jeongju [2 ]
Lim, Seung-Chan [3 ]
Joe, Sung Min [4 ]
Park, Il Han [4 ]
Park, Hyuncheol [2 ]
机构
[1] Samsung Res, Seoul 06765, South Korea
[2] Korea Adv Inst Sci & Technol, Sch Elect Engn, Daejeon 34141, South Korea
[3] Agcy Def Dev, Daejeon 34186, South Korea
[4] Samsung Elect, Hwaseong 18448, South Korea
来源
IEEE ACCESS | 2020年 / 8卷
基金
新加坡国家研究基金会;
关键词
Estimation; Threshold voltage; Decoding; Feature extraction; Training; Electronic mail; Error analysis; NAND flash memory; read reference voltage estimation; machine learning; dimension reduction; RANDOM TELEGRAPH NOISE; ARCHITECTURE; RECOVERY; CODES;
D O I
10.1109/ACCESS.2020.3026232
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
To achieve a low error rate of NAND flash memory, reliable reference voltages should be updated based on the accurate knowledge of program/erase (P/E) cycles and retention time, because those severely distort the threshold voltage distribution of memory cell. Due to the sensitivity to the temperature, however, a flash memory controller is unable to acquire the exact knowledge of retention time, meaning that it is challenging to estimate accurate read reference voltages in practice. In this article, we propose a novel machine-learning-based read reference voltage estimation framework for the NAND flash memory systems without the knowledge of retention time. To establish an unknown input-output relation of the estimation model, we derive input features by sensing and decoding memory cells in the minimum read unit. In order to define the relation between unlabeled input features and a pre-assigned class label, namely label read reference voltages, we propose three mapping functions: 1) k-nearest neighbors-based, 2) nearest-centroid-based, and 3) polynomial regression-based read reference voltage estimators. For the proposed estimation schemes, we analyze that the storage overhead and computational complexity are increasing function of the exploited feature dimension. Accordingly, we propose a feature selection (or dimension reduction) algorithm to select the minimum dimension and corresponding features to reduce the overhead and complexity while maintaining high estimation accuracy. Based on extensive numerical analysis, we validate that the derived features successfully replace unknown knowledge of retention time, and the proposed feature selection algorithm precisely adjusts the trade-off between overhead/complexity and estimation accuracy. Furthermore, the simulation and analysis results show that the proposed framework not only outperforms the conventional estimation schemes but also achieves the near-optimal frame error rate while sustaining low latency performance.
引用
收藏
页码:176416 / 176429
页数:14
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