Refractive index dispersion measurement of absorbing layers from transmittance spectra

被引：0
|
作者：
Sanchez-Perez, Celia [1 ]
Garcia-Valenzuela, Augusto [1 ]
机构：
[1] Univ Nacl Autonoma Mexico, Ctr Ciencias Aplicadas & Desarrollo Tecnol, Mexico City 04510, DF, Mexico
来源：
OPTICAL ENGINEERING | 2006年 / 45卷 / 06期
关键词：
refractive index dispersion measurement; photometric techniques; optical constants; absorbing layers;
D O I：
10.1117/1.2208560
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We describe a fast and accurate method for the measurement of refractive index spectra of absorbing layers from transmittance spectra at two angles of incidence. The method is less sensitive to surface conditions than other photometric techniques. (c) 2006 Society of Photo-Optical Instrumentation Engineers.
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页数：2
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