Process capability indices: overview and extensions

被引:22
|
作者
Stoumbos, ZG
机构
[1] Rutgers State Univ, Dept Management Sci & Informat Syst, Newark, NJ 07102 USA
[2] Rutgers State Univ, Rutgers Ctr Operat Res, RUTCOR, Newark, NJ 07102 USA
关键词
capability analysis; operating characteristic function; statistical process control; process performance; specification limits; target value;
D O I
10.1016/S1468-1218(01)00022-0
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
The process capability indices C-p, C-p*, CPL, CPU, CPL*, CPU* C-pk C-pk* C-pm and C-pm*, are presented and related to process parameters. These indices form a complementary system of measures of performance and are used by a number of U.S. and Japanese industries. Some properties of an estimator of C-pm, (C) over cap (pm) are given, and the operating characteristic curve approach is used to analyze ((C) over cap (p), (C) over cap (pm) and (C) over cap (pm)* where (C) over cap (p) and (C) over cap (pm)* are estimators of (C) over cap (p) and (C) over cap (pm)* respectively. Two tables for the analysis and use of (C) over cap (p) and Cp,, are included, and an example of application of <(C())over cap>(p), (C) over cap (pm) and (C) over cap (pk) is provided, where (C) over cap (pk) is an estimator of (C) over cap (pk). Finally, criticisms and benefits of the use of process capability indices are presented, (C) 2002 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:191 / 210
页数:20
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