Accurate estimation of aberrations of microoptics components through intensity measurements:: Numerical simulations for best positioning and noise analysis

被引：0

作者：

Soto, M ^{[1
]}

Ríos, S ^{[1
]}

Acosta, E ^{[1
]}

Voitsekhovich, V ^{[1
]}

机构：

[1] Univ Santiago de Compostela, Fac Fis, Area Opt, E-15706 Santiago De Compostela, Spain

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2000年 / 39卷 / 3B期

关键词：

phase retrieval; transport of intensity equation; aberrations; microoptical elements;

D O I：

10.1143/JJAP.39.1562

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this work we analyse the accuracy in the estimation of aberrations of microoptics components through intensity measurements by means of the transport of intensity equation (TIE) retrieval scheme. Through results of numerical simulations, the position of the measurement planes of transverse irradiance as well as the separation between them is optimised in order to minimise peak to valley values of the difference between the input wavefront and the retrieved one. Random gaussian noise with zero mean is included in the calculations.

引用

页码：1562 / 1565

页数：4