An optimal method for testing digital to analog converters

被引：3
|
作者：
Fasang, PP
机构：
来源：
TENTH ANNUAL IEEE INTERNATIONAL ASIC CONFERENCE AND EXHIBIT, PROCEEDINGS | 1997年
关键词：
D O I：
10.1109/ASIC.1997.616975
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
An optimal method for testing a type of 8-bit digital to analog converters is presented. The method uses 89 out of 256 test vectors. The method for selecting the 89 vectors is explained. It is also pointed out that digital to analog converters of the type described in this paper are tested with 100% fault coverage with the 89 vectors. In addition, the 89 vectors also test for simultaneously switching errors (noise induced errors) and differential linearity. A discussion on the type of code which is used for designing this type of digital to analog converters which renders optimal testing (with 89 vectors) is included.
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页码：42 / 46
页数：5
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