Latest Developments in the X-Ray Based Characterization of Thin-Film Solar Cells

被引：0

作者：

Stuckelberger, Michael ^{[1
]}

West, Bradley ^{[1
]}

Husein, Sebastian ^{[1
]}

Guthrey, Harvey ^{[2
]}

Al-Jassim, Mowafak ^{[2
]}

Chakraborty, Rupak ^{[3
]}

Buonassisi, Tonio ^{[3
]}

Maser, Joerg M. ^{[4
]}

Lai, Barry ^{[4
]}

Stripe, Benjamin ^{[4
]}

Rose, Volker ^{[4
,5
]}

Bertoni, Mariana ^{[1
]}

机构：

[1] Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA

[2] Natl Renewable Energy Lab, Golden, CO 80401 USA

[3] MIT, Cambridge, MA 02139 USA

[4] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[5] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

来源：

2015 IEEE 42ND PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC) | 2015年

关键词：

CdTe; CIGS; EBIC; thin-film solar cells; XBIC; XRF; BEAM-INDUCED CURRENT;

D O I：

暂无

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

We present the latest developments in the characterization of thin-film solar cells based on the combination of elemental mapping from fluorescence measurements using synchrotron x-rays, with beam induced current from electron and x-ray beams. This is a powerful method to directly correlate compositional variations with charge collection efficiency. We compare different approaches for mapping solar cells both in cross-section and in plan view on CIGS and CdTe solar cells. Based on examples from our latest research, we discuss the experimental approaches and highlight the advantages and limitations of each technique. Finally, we present an outlook to experiments that will allow x-ray based characterization to enter new fields of research that were not accessible before.

引用

页数：6

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