A non-contact atomic force microscopy and 'force spectroscopy' study of charging on oxide surfaces

被引：10
|
作者：
Pang, CL [1 ]
Ashworth, TV
Raza, H
Haycock, SA
Thornton, G
机构：
[1] Univ Manchester, Nanosci Res Ctr, Manchester M13 9PL, Lancs, England
[2] Univ Manchester, Dept Chem, Manchester M13 9PL, Lancs, England
[3] UCL, Ctr Nanotechnol, London WC1H 0AJ, England
[4] UCL, Dept Chem, London WC1H 0AJ, England
来源：
NANOTECHNOLOGY | 2004年 / 15卷 / 07期
关键词：
D O I：
10.1088/0957-4484/15/7/027
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Force spectroscopy curves from a number of oxide surfaces have been recorded. Contact potential difference (CPD) curves recorded from two different areas of an MgO(100) surface are shifted in a manner consistent with local surface charging. This charging is removed by deposition of Fe or Cu. On an NiAl(110) supported alumina film we have investigated the use of frequency shift (Deltaf) versus distance curves as an analytical tool for chemical identification. Curves recorded from the bare substrate are clearly different to those recorded over adsorbates. This difference is likely to be due to local surface charging, since such differences are not observed in detuning curves recorded from domain boundaries of similar apparent height to the adsorbates.
引用
收藏
页码：862 / 866
页数：5
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