X-ray fluorescence spectrometry

被引：0
|
作者：
Thomsen, VBE [1 ]
Schatzlein, D [1 ]
机构：
[1] NITON Corp, Billerica, MA 01821 USA
来源：
ADVANCED MATERIALS & PROCESSES | 2002年 / 160卷 / 08期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Handheld XRF spectrometers permit the nondestructive analysis of materials quickly, accurately, and on-site.
引用
收藏
页码：41 / 43
页数：3
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