Assembly of long error-prone reads using de Bruijn graphs

被引:205
|
作者
Lin, Yu [1 ]
Yuan, Jeffrey [1 ]
Kolmogorov, Mikhail [1 ]
Shen, Max W. [1 ]
Chaisson, Mark [2 ]
Pevzner, Pavel A. [1 ]
机构
[1] Univ Calif San Diego, Dept Comp Sci & Engn, San Diego, CA 92092 USA
[2] Univ Washington, Dept Genome Sci, Seattle, WA 98105 USA
关键词
de Bruijn graph; genome assembly; single-molecule sequencing; GENOMES; ALGORITHMS; BACTERIAL; SEQUENCE; CLASSIFICATION; CHROMOSOME; TOOL;
D O I
10.1073/pnas.1604560113
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The recent breakthroughs in assembling long error-prone reads were based on the overlap-layout-consensus (OLC) approach and did not utilize the strengths of the alternative de Bruijn graph approach to genome assembly. Moreover, these studies often assume that applications of the de Bruijn graph approach are limited to short and accurate reads and that the OLC approach is the only practical paradigm for assembling long error-prone reads. We show how to generalize de Bruijn graphs for assembling long error-prone reads and describe the ABruijn assembler, which combines the de Bruijn graph and the OLC approaches and results in accurate genome reconstructions.
引用
收藏
页码:E8396 / E8405
页数:10
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