A simple and accurate approach for calculating the vibration spectra of molecules on surfaces: Comparisons to high resolution electron energy loss data for ethylene on silicon

被引:12
|
作者
DiLabio, Gino A.
Dogel, Stanislav A.
Wolkow, Robert A.
机构
[1] Natl Res Council Canada, Natl Inst Nanotechnol, Edmonton, AB T6G 2V4, Canada
[2] Univ Alberta, Dept Phys, Edmonton, AB T6G 2J1, Canada
关键词
ab initio quantum chemical methods and calculations; density functional calculations; electron energy loss spectroscopy (EELS); chemisorption; surface waves - plasmons; silicon; alkenes;
D O I
10.1016/j.susc.2006.05.057
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Peak assignment is a complex but important task for analyzing the vibration spectra of surface-bound molecules. Here we describe a simple approach for calculating infrared and Raman spectra for surface-bound molecules using a cluster model approach with quantum capping potentials (QCPs). The utility of the approach is demonstrated by comparisons to the measured high resolution electron energy loss spectra for ethylene on clean silicon. By capping the silicon cluster with QCPs we computed spectra that agree very well with the HREEL spectrum, allowing us to easily assign the experimental peaks. QCPs are similar to effective core potentials, can be used with any ab initio technique and most computational chemistry packages, and their use requires no special expertise. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:L209 / L213
页数:5
相关论文
共 50 条
  • [1] High-resolution electron energy loss spectroscopy of polystyrene surfaces
    Wild, S
    Kesmodel, LL
    Apai, G
    JOURNAL OF PHYSICAL CHEMISTRY B, 2000, 104 (14): : 3179 - 3182
  • [2] High-resolution electron energy loss spectra of reconstructed Si(100) surfaces: First-principles study
    Caramella, Lucia
    Hogan, Conor
    Onida, Giovanni
    Del Sole, Rodolfo
    PHYSICAL REVIEW B, 2009, 79 (15):
  • [3] High resolution electron energy loss spectroscopy on perfect and defective oxide surfaces
    Wang, Yuemin
    ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS, 2008, 222 (5-6): : 927 - 964
  • [4] Applications of high-resolution electron energy loss spectroscopy to technical surfaces
    Indiana Univ, Bloomington, United States
    Langmuir, 6 (1355-1360):
  • [5] HIGH-RESOLUTION ELECTRON-ENERGY LOSS SPECTROSCOPY ON SEMICONDUCTOR SURFACES
    LUTH, H
    FESTKORPERPROBLEME-ADVANCES IN SOLID STATE PHYICS, 1981, 21 : 117 - 148
  • [6] High-resolution electron energy-loss spectroscopy at EuO surfaces
    Bocatius, V
    Fromme, B
    Kisker, E
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2004, 135 (01) : 41 - 46
  • [7] High-resolution electron energy loss spectroscopy of insulating polymer surfaces
    Kesmodel, LL
    Wild, S
    Apai, G
    SURFACE SCIENCE, 1999, 429 (1-3) : L475 - L480
  • [8] Applications of high-resolution electron energy loss spectroscopy to technical surfaces
    Kesmodel, LL
    LANGMUIR, 1998, 14 (06) : 1355 - 1360
  • [9] Analysis of polar GaN surfaces with photoelectron and high resolution electron energy loss spectroscopy
    Lorenz, Pierre
    Haensel, Thomas
    Gutt, Richard
    Koch, Roland J.
    Schaefer, Juergen A.
    Krischok, Stefan
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2010, 247 (07): : 1658 - 1661
  • [10] Applications of high-resolution electron energy loss spectroscopy to technical surfaces.
    Kesmodel, LL
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1997, 213 : 70 - COLL