Accurate structure refinement of thin films using 3D electron diffraction data

被引：0
|
作者：
Steciuk, Gwladys [1 ]
Palatinus, Lukas [2 ]
Boullay, Philippe [1 ]
David, Adrian [1 ]
Lacotte, Morgane [1 ]
Copie, Olivier [1 ]
Prellier, Wilfrid [1 ]
Rotella, Helene [1 ]
机构：
[1] CNRS UMR 6508, CRISMAT, F-14050 Caen, France
[2] AS CR, Inst Phys, Vvi, Prague 18221, Czech Republic
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2015年 / 71卷
关键词：
precession electron diffraction tomography; structure refinement; thin film;
D O I：
10.1107/S2053273315093997
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS27-P5
引用
收藏
页码：S405 / S405
页数：1
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