From Complex Near-Field Measurements to Radiated Emissions Modelling of Electronic Equipments

This paper proposes a complete flow to model the radiated emissions (RE) of electronic components, board and equipments from near-field measurements. A precise RE model needs accurate vector field (amplitude and phase) information, but obtaining the same is not always straightforward. A novel method to measure the vector near-field data using the near-field scan (NFS) technique is first presented. The measurement technique extends the limitations of the existing NFS practices to provide an accurate and stable magnitude and phase information of the fields of arbitrary printed circuit boards (PCBs). The measured vector field-data is then used as input for modelling the RE of the equipment under test with the use of elementary electric and/or magnetic dipoles. The modelling philosophy, from measurements to model construction, is presented and validated on a LED turn-lights developed by Valeo.