Laser Induced Breakdown Spectroscopy to Detect Copper Contamination in Transformer Insulation

被引：0
|
作者：
Aparna, N. [1 ]
Wazeem, M. A. [1 ]
Vasa, Nilesh J. [1 ]
Sarathi, R. [2 ]
Rajan, Sundara J. [3 ]
机构：
[1] Indian Inst Technol, Dept Engn Design, Madras 600036, Tamil Nadu, India
[2] Indian Inst Technol, Dept Elect Engn, Madras 600036, Tamil Nadu, India
[3] Cent Power Res Inst, Bangalore 560080, Karnataka, India
来源：
2013 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR) | 2013年
关键词：
D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Laser Induced Breakdown Spectroscopy combined with a laser-ablation based depth profiling technique is demonstrated for the detection of copper contamination in transformer insulation. An increase in copper diffusion was found with ageing.
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页数：2
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