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Special Issue on the 2017 IEEE International Instrumentation and Measurement Technology Conference
被引:0
|作者:
Rapuano, Sergio
[1
]
Catunda, Sebastian Yuri
[2
]
Yang, Wuqiang
[3
]
机构:
[1] Univ Sannio, Elect & Elect Measurement, Benevento, Italy
[2] Univ Fed Rio Grande do Norte, Dept Comp Engn & Automat, Natal, RN, Brazil
[3] Univ Manchester, Manchester, Lancs, England
关键词:
D O I:
10.1109/TIM.2018.2813779
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
引用
收藏
页码:982 / 983
页数:2
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