Experimental observation of negative differential conductance in three-terminal silicon tunneling device

被引：0
|
作者：
Koga, JJ [1 ]
Toriumi, A [1 ]
机构：
[1] TOSHIBA CO LTD,ULSI RES LABS,SAIWAI KU,KAWASAKI,KANAGAWA 210,JAPAN
来源：
1996 54TH ANNUAL DEVICE RESEARCH CONFERENCE DIGEST | 1996年
关键词：
D O I：
10.1109/DRC.1996.546426
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：176 / 177
页数：2
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