共 50 条
- [1] Assesment of CPI stress impact on IC reliability and performance in 2.5D/3D packages 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2019,
- [2] Reliability Challenges in 2.5D and 3D IC Integration 2017 IEEE 67TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2017), 2017, : 1504 - 1509
- [4] TSV Manufacturing Yield and Hidden Costs for 3D IC Integration 2010 PROCEEDINGS 60TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2010, : 1031 - 1042
- [6] 3D/2.5D Stacked IC Cost Modeling and Test Flow Selection 2014 9TH IEEE INTERNATIONAL CONFERENCE ON DESIGN & TECHNOLOGY OF INTEGRATED SYSTEMS IN NANOSCALE ERA (DTIS 2014), 2014,
- [7] Novel Thinning/Backside Passivation for Substrate Coupling Depression of 3D IC 2011 IEEE 61ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2011, : 1395 - 1399
- [8] Turtle Base with Fin Perforated Heat Exchangers for the 2.5D and 3D IC Structures 2017 12TH INTERNATIONAL MICROSYSTEMS, PACKAGING, ASSEMBLY AND CIRCUITS TECHNOLOGY CONFERENCE (IMPACT), 2017, : 97 - 101
- [9] Development of High Modulus Temporary Bonding Material for 2.5D/3D IC Integration 2024 25TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT, 2024,
- [10] Impact of 3D IC on NoC Topologies: A Wire Delay Consideration 16TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN (DSD 2013), 2013, : 68 - 72