Characterization of Head Overcoat for 1 Tb/in2 Magnetic Recording

被引:25
|
作者
Yasui, Nobuto [1 ]
Inaba, Hiroshi [1 ]
Furusawa, Kenji [1 ]
Saito, Masanori [2 ]
Ohtake, Naoto [3 ]
机构
[1] Hitachi Ltd, Prod Engn Res Lab, Totsuka Ku, Yokohama, Kanagawa 2440817, Japan
[2] Tokyo Inst Technol, Dept Mech Sci & Engn, Meguro Ku, Tokyo 1528552, Japan
[3] Nagoya Univ, Grad Sch Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan
关键词
Diamond-like carbon (DLC); magnetic recording; AMORPHOUS-CARBON FILMS; THIN-FILMS; SP(3); ARC;
D O I
10.1109/TMAG.2008.2010636
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To achieve a 1 Tb/in(2) system, diamond-like carbon (DLC) overcoats on head and disk have to meet the criteria of corrosion- and wear-resistance at thicknesses of less than 2 nm. This paper will assess the performance of head and disk overcoat for a 1 Tb/in(2) System and beyond, with focus on the influence of DLC forming technologies, thickness, and substrate materials. To evaluate DLC film, sp(3) fraction was measured by X-ray photoelectron spectroscopy (XPS). It was shown that DLC films fabricated by filtered cathodic vacuum arc (FCVA) would have less sp(3) fraction with decreasing thickness. To evaluate corrosion- and wear-resistance, coverage and critical loads were measured by XPS and atomic force microscopy scratch test. XPS revealed that DLC films prepared by both FCVA and ion-assisted sputtering had sufficient coverage at thickness of down to 1 nm. Atomic force microscopy scratch test showed that critical load depends on substrate materials and DLC thickness, not on DLC forming methods.
引用
收藏
页码:805 / 809
页数:5
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