Add-on lens attachments for the scanning electron microscope

被引：0
|
作者：
Khursheed, A [1 ]
机构：
[1] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore
来源：
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 122 | 2002年 / 122卷
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中图分类号：
O59 [应用物理学];
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页码：87 / 172
页数：86
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